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<\/a><\/td> Texas Instruments<\/b>
IC SCAN TEST DEVICE BUFF 24-SOIC<\/span><\/a>
详细描述：Scan Test Device with Buffers IC 24-SOIC

型号：SN74BCT8244ADW<\/a>
仓库库存编号：SN74BCT8244ADW-ND<\/a>
别名：SN74BCT8244ADWG4 SN74BCT8244ADWG4-ND <\/td>
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<\/a><\/td> Texas Instruments<\/b>
IC SCAN TEST DEVICE BUFF 24-SOIC<\/span><\/a>
详细描述：Scan Test Device with Buffers IC 24-SOIC

型号：SN74BCT8244ADWE4<\/a>
仓库库存编号：SN74BCT8244ADWE4-ND<\/a>
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<\/a><\/td> Texas Instruments<\/b>
IC SCAN TEST DEVICE BUFF 24-SOIC<\/span><\/a>
详细描述：Scan Test Device with Buffers IC 24-SOIC

型号：SN74BCT8244ADWR<\/a>
仓库库存编号：SN74BCT8244ADWR-ND<\/a>
别名：SN74BCT8244ADWRE4 SN74BCT8244ADWRE4-ND SN74BCT8244ADWRG4 SN74BCT8244ADWRG4-ND <\/td>
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参考图片<\/td>	制造商 \/ 描述 \/ 型号 \/ 仓库库存编号 \/ 别名<\/td>	PDF<\/td>	操作<\/td> <\/tr>
<\/a><\/td>	Texas Instruments<\/b> IC SCAN TEST DEVICE BUFF 24-SOIC<\/span><\/a> 详细描述：Scan Test Device with Buffers IC 24-SOIC 型号：SN74BCT8244ADW<\/a> 仓库库存编号：SN74BCT8244ADW-ND<\/a> 别名：SN74BCT8244ADWG4 <br>SN74BCT8244ADWG4-ND <br> <\/td>	<\/a> <\/div> 无铅<\/td>	搜索<\/a><\/td><\/tr>
<\/a><\/td>	Texas Instruments<\/b> IC SCAN TEST DEVICE BUFF 24-SOIC<\/span><\/a> 详细描述：Scan Test Device with Buffers IC 24-SOIC 型号：SN74BCT8244ADWE4<\/a> 仓库库存编号：SN74BCT8244ADWE4-ND<\/a> <\/td>	<\/a> <\/div> 无铅<\/td>	搜索<\/a><\/td><\/tr>
<\/a><\/td>	Texas Instruments<\/b> IC SCAN TEST DEVICE BUFF 24-SOIC<\/span><\/a> 详细描述：Scan Test Device with Buffers IC 24-SOIC 型号：SN74BCT8244ADWR<\/a> 仓库库存编号：SN74BCT8244ADWR-ND<\/a> 别名：SN74BCT8244ADWRE4 <br>SN74BCT8244ADWRE4-ND <br>SN74BCT8244ADWRG4 <br>SN74BCT8244ADWRG4-ND <br> <\/td>	<\/a> <\/div> 无铅<\/td>	搜索<\/a><\/td><\/tr><\/table>";